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The new Scanning Electron Microscope offers 10x better resolution for nano-scale characterization.
A team of senior engineering students has published findings that could reduce testing time by 30% for high-frequency microchips.
Read Full ReportThe new Scanning Electron Microscope offers 10x better resolution for nano-scale characterization.
Faculty welcomed 200 local high school students to tour the MPCT facilities and learn about chips.
A new internship pipeline guarantees summer positions for top performing MPCT students.