Nanometrology
Surface Characterization
B-2 Atomic Force Microscope
The AFM Workshop B-2 is a versatile atomic force microscope designed for both advanced research and educational training. It provides high-resolution 3D topographical imaging and supports multiple scanning modes, making it an essential tool for characterizing nanomaterials, biological samples, and thin films.
Capabilities & Modes
- Vibrating (Tapping) Mode: Ideal for soft or fragile samples to minimize surface damage during scanning.
- Contact Mode: Provides high-resolution topography for hard surfaces.
- Phase Imaging: Detect variations in surface composition, adhesion, friction, and viscoelasticity.
- Lateral Force Microscopy (LFM): Measures surface friction on the nanoscale.
- Open Design: Allows for easy modification and integration with other optical systems.
Technical Specifications
| XY Scan Range | 50 µm x 50 µm (Standard) |
| Z Scan Range | 17 µm |
| Z Noise Floor | < 0.08 nm |
| Sample Size | Max 25 mm diameter, 13 mm thick |
| Video Microscope | 400x Zoom, 2µm resolution |
| Probe Approach | Automated Stepper Motor |
Comparison: AFM vs Profilometer
| Feature | B-2 AFM | Stylus Profilometer |
|---|---|---|
| Lateral Resolution | Nanometer Scale | Micron Scale |
| Vertical Resolution | < 0.1 nm | ~ 1 nm |
| 3D Imaging | Native (XYZ) | Line Scan (2D) |
| Sample Damage | Minimal (Tapping Mode) | Contact Only (Scratch Risk) |
| Scan Area | Small (50 µm max) | Large (mm to cm) |
AFM Sample Images
Atomic Lattice
DNA Strands
Surface Roughness
Access
ONLINEStep 1: Theory
AFM Basics (Canvas)Step 2: Training
Probe Loading & Scan (2hr)
Step 3: Access
Independent Booking
Tool Owner
Hourly Rates
Internal (Academic)
$60/hr
External (Industry)
$150/hr
Staff Assisted
+$50/hr
* Rates include probe usage.