Keyence VHX-7000

4K Ultra-High Accuracy Digital Microscope

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Keyence VHX-7000

Standard Setup in Room 102

Instrument Overview

The Keyence VHX-7000 is our flagship optical metrology system, bridging the gap between traditional optical microscopy and SEM (Scanning Electron Microscopy). It utilizes a 4K CMOS sensor and advanced lighting algorithms to capture fully-focused images of uneven surfaces instantly.

Ideal for: Wafer inspection, MEMS device characterization, Failure analysis, and Roughness measurements.

6000x Zoom
Z-Stacking
3D Profiling
Auto Measure

Sample Gallery

PCB Solder Joint
Silicon Etch Profile
MEMS Structure (3D)

Technical Specifications

Sensor 1/1.8-inch CMOS image sensor
Effective Pixels 3840 (H) x 2160 (V)
Frame Rate 50 fps (max)
Illumination High-intensity LED (Ring, Coaxial, Mixed)
Stage Motorized XYZ with 100mm x 100mm travel
Data Output .JPEG, .TIFF, .CSV (Measurement data)

Usage Rates

Academic / Internal

$45/hr

Unassisted Use

External / Industry

$120/hr

Staff Assisted: +$50/hr

Tool Owner

Dr. Sarah Miller

sarah.miller@nau.edu

Engineering Building 69

Room 102, Bay 1 (Metrology)

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